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Our Japanese representative will attend the 42nd Fullerenes-Nanotubes-Graphene General Symposium in Tokyo, 6-8 March.


If you plan to attend the 66th annual meeting of the Physics Society of Japan, held 24-27 March in Kwansei-Gakuin University, don't miss our poster on thermoelectric properties of graphene (Seebeck coefficient etc).


We will have a booth in the exhibit of the Graphene 2012 conference in Brussels, Belgium, 10-13 April.


We plan to attend the 15th International Workshop on Computational Electronics (IWCE) in Madison (Wisconsin, USA), 22-25 May.

Article about ATK-SE PDF Print E-mail
Monday, 23 August 2010 10:54

An article describing how the extended Hückel model in ATK-SE works has been published in PRB.


The article contains a detailed description about how the Hückel model has been adapted for transport calculations, in particular the inclusion of a Hartree term for coupling to the electrostatic potential of gate electrodes and dielectric regions. 

Two examples of how the method can be applied are presented in the article:

asym-device2 graphene-device
A calculation of the transport properties of a Tour wire, which turns out to be better described by the Hückel model than DFT, when comparing to experimental results.
A study of a z-shaped graphene nano-transistor (similar to that considered by Q. Yan et al.), which exhibits an interesting transition from tunneling transport to thermionic emission as the central part is made longer.

This article serves as the fundamental reference for the extended Hückel model as implemented in ATK, and should be cited in any publication that makes use of this method.

The full reference is

Kurt Stokbro, Dan Erik Petersen, Søren Smidstrup, Anders Blom, Mads Ipsen, and Kristen Kaasbjerg,
Semiempirical model for nanoscale device simulations,
Physical Review B 82(7), 075420 (2010).

The article can be obtained from APS via doi:10.1103/PhysRevB.82.075420, and it can also be downloaded in preprint format from arXiv:1004.2812v1 [cond-mat.mes-hall].

Phys. Rev. B 82, 075420 (2010) [7 pages]

Semiempirical model for nanoscale device simulations

 
 
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